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Apr 24

Adapting OpenAI's CLIP Model for Few-Shot Image Inspection in Manufacturing Quality Control: An Expository Case Study with Multiple Application Examples

This expository paper introduces a simplified approach to image-based quality inspection in manufacturing using OpenAI's CLIP (Contrastive Language-Image Pretraining) model adapted for few-shot learning. While CLIP has demonstrated impressive capabilities in general computer vision tasks, its direct application to manufacturing inspection presents challenges due to the domain gap between its training data and industrial applications. We evaluate CLIP's effectiveness through five case studies: metallic pan surface inspection, 3D printing extrusion profile analysis, stochastic textured surface evaluation, automotive assembly inspection, and microstructure image classification. Our results show that CLIP can achieve high classification accuracy with relatively small learning sets (50-100 examples per class) for single-component and texture-based applications. However, the performance degrades with complex multi-component scenes. We provide a practical implementation framework that enables quality engineers to quickly assess CLIP's suitability for their specific applications before pursuing more complex solutions. This work establishes CLIP-based few-shot learning as an effective baseline approach that balances implementation simplicity with robust performance, demonstrated in several manufacturing quality control applications.

Deep Learning Based Defect Detection for Solder Joints on Industrial X-Ray Circuit Board Images

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

Automotive Perception Software Development: An Empirical Investigation into Data, Annotation, and Ecosystem Challenges

Software that contains machine learning algorithms is an integral part of automotive perception, for example, in driving automation systems. The development of such software, specifically the training and validation of the machine learning components, require large annotated datasets. An industry of data and annotation services has emerged to serve the development of such data-intensive automotive software components. Wide-spread difficulties to specify data and annotation needs challenge collaborations between OEMs (Original Equipment Manufacturers) and their suppliers of software components, data, and annotations. This paper investigates the reasons for these difficulties for practitioners in the Swedish automotive industry to arrive at clear specifications for data and annotations. The results from an interview study show that a lack of effective metrics for data quality aspects, ambiguities in the way of working, unclear definitions of annotation quality, and deficits in the business ecosystems are causes for the difficulty in deriving the specifications. We provide a list of recommendations that can mitigate challenges when deriving specifications and we propose future research opportunities to overcome these challenges. Our work contributes towards the on-going research on accountability of machine learning as applied to complex software systems, especially for high-stake applications such as automated driving.

ASDF: Assembly State Detection Utilizing Late Fusion by Integrating 6D Pose Estimation

In medical and industrial domains, providing guidance for assembly processes can be critical to ensure efficiency and safety. Errors in assembly can lead to significant consequences such as extended surgery times and prolonged manufacturing or maintenance times in industry. Assembly scenarios can benefit from in-situ augmented reality visualization, i.e., augmentations in close proximity to the target object, to provide guidance, reduce assembly times, and minimize errors. In order to enable in-situ visualization, 6D pose estimation can be leveraged to identify the correct location for an augmentation. Existing 6D pose estimation techniques primarily focus on individual objects and static captures. However, assembly scenarios have various dynamics, including occlusion during assembly and dynamics in the appearance of assembly objects. Existing work focus either on object detection combined with state detection, or focus purely on the pose estimation. To address the challenges of 6D pose estimation in combination with assembly state detection, our approach ASDF builds upon the strengths of YOLOv8, a real-time capable object detection framework. We extend this framework, refine the object pose, and fuse pose knowledge with network-detected pose information. Utilizing our late fusion in our Pose2State module results in refined 6D pose estimation and assembly state detection. By combining both pose and state information, our Pose2State module predicts the final assembly state with precision. The evaluation of our ASDF dataset shows that our Pose2State module leads to an improved assembly state detection and that the improvement of the assembly state further leads to a more robust 6D pose estimation. Moreover, on the GBOT dataset, we outperform the pure deep learning-based network and even outperform the hybrid and pure tracking-based approaches.

ChangeChip: A Reference-Based Unsupervised Change Detection for PCB Defect Detection

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Self-supervised Feature Adaptation for 3D Industrial Anomaly Detection

Industrial anomaly detection is generally addressed as an unsupervised task that aims at locating defects with only normal training samples. Recently, numerous 2D anomaly detection methods have been proposed and have achieved promising results, however, using only the 2D RGB data as input is not sufficient to identify imperceptible geometric surface anomalies. Hence, in this work, we focus on multi-modal anomaly detection. Specifically, we investigate early multi-modal approaches that attempted to utilize models pre-trained on large-scale visual datasets, i.e., ImageNet, to construct feature databases. And we empirically find that directly using these pre-trained models is not optimal, it can either fail to detect subtle defects or mistake abnormal features as normal ones. This may be attributed to the domain gap between target industrial data and source data.Towards this problem, we propose a Local-to-global Self-supervised Feature Adaptation (LSFA) method to finetune the adaptors and learn task-oriented representation toward anomaly detection.Both intra-modal adaptation and cross-modal alignment are optimized from a local-to-global perspective in LSFA to ensure the representation quality and consistency in the inference stage.Extensive experiments demonstrate that our method not only brings a significant performance boost to feature embedding based approaches, but also outperforms previous State-of-The-Art (SoTA) methods prominently on both MVTec-3D AD and Eyecandies datasets, e.g., LSFA achieves 97.1% I-AUROC on MVTec-3D, surpass previous SoTA by +3.4%.

Automatic assembly of aero engine low pressure turbine shaft based on 3D vision measurement

In order to solve the problem of low automation of Aero-engine Turbine shaft assembly and the difficulty of non-contact high-precision measurement, a structured light binocular measurement technology for key components of aero-engine is proposed in this paper. Combined with three-dimensional point cloud data processing and assembly position matching algorithm, the high-precision measurement of shaft hole assembly posture in the process of turbine shaft docking is realized. Firstly, the screw thread curve on the bolt surface is segmented based on PCA projection and edge point cloud clustering, and Hough transform is used to model fit the three-dimensional thread curve. Then the preprocessed two-dimensional convex hull is constructed to segment the key hole location features, and the mounting surface and hole location obtained by segmentation are fitted based on RANSAC method. Finally, the geometric feature matching is used the evaluation index of turbine shaft assembly is established to optimize the pose. The final measurement accuracy of mounting surface matching is less than 0.05mm, and the measurement accuracy of mounting hole matching based on minimum ance optimization is less than 0.1 degree. The measurement algorithm is implemented on the automatic assembly test-bed of a certain type of aero-engine low-pressure turbine rotor. In the narrow installation space, the assembly process of the turbine shaft assembly, such as the automatic alignment and docking of the shaft hole, the automatic heating and temperature measurement of the installation seam, and the automatic tightening of the two guns, are realized in the narrow installation space Guidance, real-time inspection and assembly result evaluation.

Deep Open-Set Recognition for Silicon Wafer Production Monitoring

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

From Accidents to Insights: Leveraging Multimodal Data for Scenario-Driven ADS Testing

The rapid advancements in Autonomous Driving Systems (ADS) have necessitated robust software testing to ensure safety and reliability. However, automating the generation of scalable and concrete test scenarios remains a significant challenge. Current scenario-based test case generation methods often face limitations, such as unrealistic scenes and inaccurate vehicle trajectories. These challenges largely result from the loss of map information during data extraction and the lack of an effective verification mechanism to mitigate hallucinations in large language models (LLMs). This paper introduces TRACE, a scenario-based ADS Test case Generation framework for Critical Scenarios. By leveraging multimodal data to extract challenging scenarios from real-world car crash reports, TRACE constructs numerous critical test cases with less data, significantly enhancing ADS bug detection efficiency. Using in-context learning, chain-of-thought prompting, and self-validation approaches, we use LLMs to extract environmental and road network information from crash reports. For vehicle trajectory planning, data containing map information and vehicle coordinates serves as a knowledge base to build a ChatGPT-based LLM with path-planning capabilities, which we named TrackMate. Based on 50 existing crash reports, our approach successfully tested three ADS models across two simulation platforms, MetaDrive and BeamNG. Of the 290 constructed test scenarios, 127 are identified as critical, as they resulted in vehicle collisions. Additionally, user feedback reveals that TRACE demonstrates superior scenario reconstruction accuracy, with 77.5% of the scenarios being rated as 'mostly or 'totally' consistent, compared to only 27% for the most related SOTA, LCTGen.

VegaEdge: Edge AI Confluence Anomaly Detection for Real-Time Highway IoT-Applications

Vehicle anomaly detection plays a vital role in highway safety applications such as accident prevention, rapid response, traffic flow optimization, and work zone safety. With the surge of the Internet of Things (IoT) in recent years, there has arisen a pressing demand for Artificial Intelligence (AI) based anomaly detection methods designed to meet the requirements of IoT devices. Catering to this futuristic vision, we introduce a lightweight approach to vehicle anomaly detection by utilizing the power of trajectory prediction. Our proposed design identifies vehicles deviating from expected paths, indicating highway risks from different camera-viewing angles from real-world highway datasets. On top of that, we present VegaEdge - a sophisticated AI confluence designed for real-time security and surveillance applications in modern highway settings through edge-centric IoT-embedded platforms equipped with our anomaly detection approach. Extensive testing across multiple platforms and traffic scenarios showcases the versatility and effectiveness of VegaEdge. This work also presents the Carolinas Anomaly Dataset (CAD), to bridge the existing gap in datasets tailored for highway anomalies. In real-world scenarios, our anomaly detection approach achieves an AUC-ROC of 0.94, and our proposed VegaEdge design, on an embedded IoT platform, processes 738 trajectories per second in a typical highway setting. The dataset is available at https://github.com/TeCSAR-UNCC/Carolinas_Dataset#chd-anomaly-test-set .

Exploring Intrinsic Normal Prototypes within a Single Image for Universal Anomaly Detection

Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.

Guess & Sketch: Language Model Guided Transpilation

Maintaining legacy software requires many software and systems engineering hours. Assembly code programs, which demand low-level control over the computer machine state and have no variable names, are particularly difficult for humans to analyze. Existing conventional program translators guarantee correctness, but are hand-engineered for the source and target programming languages in question. Learned transpilation, i.e. automatic translation of code, offers an alternative to manual re-writing and engineering efforts. Automated symbolic program translation approaches guarantee correctness but struggle to scale to longer programs due to the exponentially large search space. Their rigid rule-based systems also limit their expressivity, so they can only reason about a reduced space of programs. Probabilistic neural language models (LMs) produce plausible outputs for every input, but do so at the cost of guaranteed correctness. In this work, we leverage the strengths of LMs and symbolic solvers in a neurosymbolic approach to learned transpilation for assembly code. Assembly code is an appropriate setting for a neurosymbolic approach, since assembly code can be divided into shorter non-branching basic blocks amenable to the use of symbolic methods. Guess & Sketch extracts alignment and confidence information from features of the LM then passes it to a symbolic solver to resolve semantic equivalence of the transpilation input and output. We test Guess & Sketch on three different test sets of assembly transpilation tasks, varying in difficulty, and show that it successfully transpiles 57.6% more examples than GPT-4 and 39.6% more examples than an engineered transpiler. We also share a training and evaluation dataset for this task.

AnomalyGPT: Detecting Industrial Anomalies using Large Vision-Language Models

Large Vision-Language Models (LVLMs) such as MiniGPT-4 and LLaVA have demonstrated the capability of understanding images and achieved remarkable performance in various visual tasks. Despite their strong abilities in recognizing common objects due to extensive training datasets, they lack specific domain knowledge and have a weaker understanding of localized details within objects, which hinders their effectiveness in the Industrial Anomaly Detection (IAD) task. On the other hand, most existing IAD methods only provide anomaly scores and necessitate the manual setting of thresholds to distinguish between normal and abnormal samples, which restricts their practical implementation. In this paper, we explore the utilization of LVLM to address the IAD problem and propose AnomalyGPT, a novel IAD approach based on LVLM. We generate training data by simulating anomalous images and producing corresponding textual descriptions for each image. We also employ an image decoder to provide fine-grained semantic and design a prompt learner to fine-tune the LVLM using prompt embeddings. Our AnomalyGPT eliminates the need for manual threshold adjustments, thus directly assesses the presence and locations of anomalies. Additionally, AnomalyGPT supports multi-turn dialogues and exhibits impressive few-shot in-context learning capabilities. With only one normal shot, AnomalyGPT achieves the state-of-the-art performance with an accuracy of 86.1%, an image-level AUC of 94.1%, and a pixel-level AUC of 95.3% on the MVTec-AD dataset. Code is available at https://github.com/CASIA-IVA-Lab/AnomalyGPT.